Specifications
N-SIM (structured illumination microscopy)
- Motorized inverted Nikon ECLIPSE Ti-E TIRF microscope with perfect focus system
- Lasers: 405 nm, 488 nm, 561 nm, 640 nm
- Objective lens
- CFI SR Apochromat TIRF 100×oil (NA1.49)
- CFI 20x
- ORCA-Flash 4.0 sCMOS camera
- NIS-Elements A
N-STORM (STochastic Optical Reconstruction Microscopy)
- Lateral (XY) resolution ~20-30 nm
- Axial (Z) resolution ~50 nm
Details
N-SIM (structured illumination microscopy)
- Double the R\resolution of conventional optical microscopes (xy 115 nm, z 300 nm)
- Applicable to any sample prepared for conventional fluorescence microscopy – no special fluorophore needed
- Fast temporal resolution of approximately 1 sec/frame
- For more information visit https://www.nikoninstruments.com/Products/Super-resolution/N-SIM-E-Super-Resolution
N-STORM (STochastic Optical Reconstruction Microscopy)
- The N-STORM super-resolution microscope provides 10 times that of conventional optical microscopes
- For more information visit https://www.nikoninstruments.com/Products/Super-resolution/N-STORM-Super-Resolution
Acknowledgement
Users of this instrument are required to acknowledge the Huck Institutes’ Microscopy Core Facility (RRID: SCR_024457) in any resulting publications. Please review the acknowledgment and co-authorship guidelines for full details.