Uses
- Lamella preparation for CryoET and Volume EM
- Correlative light electron microscopy (CLEM)
- Slice-by-slice SEM imaging
Specifications
- Four different ion sources (xenon, argon, nitrogen, and oxygen) for fast milling
- The integrated cryo-stage and cryo-transfer module provide a stable cryogenic sample preparation environment
- The Easylift Cryo Lift-Out System supports lamella preparation from bulk high-pressure frozen (HPF) specimens
- Integrated fluorescence light microscope (iFLM) correlates the light microscopy information with the SEM data
- Three chemical coating materials (Platinum, Carbon, and Tungsten) for a wider range of protection
- AutoTEM Cryo, MAPS 3, and Auto Slice and View software packages facilitate sample preparation and data collection
Acknowledgement
Users of this instrument are required to acknowledge the Huck Institutes’ Cryo-Electron Microscopy Core Facility RRID (SCR_024456) in any resulting publications. Please review the acknowledgment and co-authorship guidelines for full details.