Uses
- Sample screening and optimization
- High-throughput data collection for single-particle reconstruction
- MicroED data collection
Specifications
- High brightness field emission gun (X-FEG)
- Two-condenser lens system
- Cryo-Autoloader
- Single-axis tilt CompuStage
- Falcon 4i direct electron detector
- Aberration Free Image Shift (AFIS) for fast data collection
- Smart EPU and MicroED software
Acknowledgement
Users of this instrument are required to acknowledge the Huck Institutes’ Cryo-Electron Microscopy Core Facility RRID (SCR_024456) in any resulting publications. Please review the acknowledgment and co-authorship guidelines for full details.
Research reported here is supported by the NIH grant S10OD025145. When recognizing contributions made using the FEI Talos Arctica G2, please add this sentence in the acknowledgements: “Research reported in this publication was supported by the Office of
the Director, NIH, under award number S10OD026822-01 (S.L.H.)”